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Signal Generators Products
![SE1750[1].jpg](https://static.wixstatic.com/media/344984_1e3734c2e6734ae7860d7138a1e1c947~mv2.jpg/v1/fill/w_456,h_282,al_c,q_80,usm_0.66_1.00_0.01,enc_avif,quality_auto/SE1750%5B1%5D.jpg)
SE1750
The SE1750 is an advanced Digital Sampling Oscilloscope (DSO) with Clock Data Recovery (CDR) capabilities. It performs precise eye-diagram analysis at 32 GHz or 50 GHz to assess transmitter and receiver quality, using statistical under-sampling techniques. Equipped with comprehensive software libraries, it supports eye measurements, jitter analysis, and NRZ/PAM4 data processing.
![SE1732[1].jpg](https://static.wixstatic.com/media/344984_65c885779c0045aeade8b60ae58898e0~mv2.jpg/v1/fill/w_451,h_295,al_c,q_80,usm_0.66_1.00_0.01,enc_avif,quality_auto/SE1732%5B1%5D.jpg)
SE1732
The SE1732 is a high-performance Digital Sampling Oscilloscope (DSO) with integrated Clock Data Recovery (CDR). It provides precise analysis at 32 GHz or 50 GHz to evaluate the performance of transmitters and receivers, leveraging statistical under-sampling techniques. With robust software libraries, it supports, jitter analysis, and NRZ/PAM4 data processing. The SE1732 is tailored for both characterization and manufacturing environments, ensuring accurate and reliable signal assessment.
![SE1792-A2[1].jpg](https://static.wixstatic.com/media/344984_68ce6599373a43b4be7d2939011599f8~mv2.jpg/v1/fill/w_400,h_292,al_c,q_80,usm_0.66_1.00_0.01,enc_avif,quality_auto/SE1792-A2%5B1%5D.jpg)
SE1792-A2
The SE1792-A2 -gen2 is a state-of-the-art 4 Channel Digital Sampling Oscilloscope available as an ATE board. The DSO automatically performs accurate eye diagram analysis at 35 GHz to characterize the quality of transmitters, implementing a statistical under-sampling technique with comprehensive software libraries used for eye measurements, jitter analysis and processing of NRZ/PAM4 data.
SE1702
The SE1702 is a state-of-the-art TDR/TDT and a Digital Sampling Oscilloscope at the same time. The DSO automatically performs accurate eye- diagram analysis at 35 GHz to characterize the quality of transmitters and receivers, implementing a statistical under-sampling technique with comprehensive software libraries used for eye measurements, jitter analysis and processing of NRZ/PAM4 data. The true- differential TDR/TDT is used to determine the impedance profile, reflection and transmission losses of components on 4 channels simultaneously. It is designed for characterization as well as manufacturing. The 4 differential PPG ports can generate pulse patterns at 53 Gpbs NRZ, thus enabling Sdd21 measurements beyond 35 GHz. The SE1702 can be configured to measure TDR with a range of 10 meters. It has a pulse rise time of 12ps that allows to resolve impedance discontinuities as close as 1.5mm apart. The dynamic range is 60dB.