SE1750

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The SE1750 is an advanced Digital Sampling Oscilloscope (DSO) with Clock Data Recovery (CDR) capabilities. It performs precise eye-diagram analysis at 32 GHz or 50 GHz to assess transmitter and receiver quality, using statistical under-sampling techniques. Equipped with comprehensive software libraries, it supports eye measurements, jitter analysis, and NRZ/PAM4 data processing.

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Electrical Specifications

Parameter	Symbol	Condition	Min	Typ	Max	Unit
Input Bandwidth (programmable)					32/50	GHz
Input Amplitude		S.E./Diff.			600/1200	mVpp
Input Rise / Fall Time (20% to 80%)	tRT, tFT			14 for 32GHz 11 for 50GHz		pS
Vertical Resolution				12		bits
Clock Input range (normal mode)			10KHz		550	MHz
Clock Input range (bypass mode)			10KHz		125	MHz
Clock Input Amplitude		SE			1000	mV
Input Impedance	Z			50		Ω
Intrinsic Jitter (excluding DDJ)		Note¹			200fS	rms
Amplitude Error (rms)		Note²		4		mV rms
Data Format support				NRZ, PAM4
PRBS Pattern Capture		Note³			PRBS13
CDR Sensitivity				100		mV
CDR LBW				10		MHz
Spurious-Free Dynamic Range (sine wave)	SFDR			-58 dBc at 10 GHz, 50 mVpp, 1 GS/s -53 dBc at 30 GHz, 50 mVpp, 1 GS/s
Memory depth				256K		Samples
Power rating				1.6A @12Vdc
Return Loss		20 GHz			-15	dB

Notes

1. Intrinsic Jitter is the additional jitter uncertainty of the DSO as the statistical sum of the sampler, the timing generator, and DSO interconnect.

2. Related to calibration time @600mV input over the operating temperature range.

3. For all measurements that require pattern lock. For all other measurements, the SE1732 supports up to PRBS 31.