top of page
Spruce Website Images (6).png

Products

SE1746

The SE1746 enhances its functionality by adding support for GPON, EPON, and 10GPON testing. It features two filter inputs and outputs accessible directly from the faceplate, providing easy connectivity. Additionally, it includes a burst control signal generator designed for asymmetric PON CDR mode, leveraging the combined capabilities of the Digital Sampling Oscilloscope (DSO) and FPGA for advanced signal management and testing.

Electrical Specifications

Bit Rates
PAM4: 18.5 - 29 GBaud / 37 - 61 GBaud NRZ: 18.5 ? 29 Gbps / 37 - 61 Gbps
TX Amplitude Differential
0 - 1200 mVpp at High Rates & 0 ? 1800 mVpp at Low Rates
Patterns
PRBS 7/9/11/13/15/16/23/31/58/9.4 SQ16, SQ32, LIN, CJT, JP0838, SSPRQ, User Defined
TX Amplitude Adjustment
Steps of 1 mV
Pre-emphasis resolution
1000 steps
Pre- / Post-emphasis
6 dB
Equalizing Filter Spacing
1 UI
Random Jitter RMS?
< 290 fs
Rise/ Fall Time (20?80%)?
< 10 ps
Coding
Gray coding supported
FEC (up to 800G)
KP (100G, 400G)
KR (100G)
Output Return Loss up to 10 GHz
< -15 dB
Output Return Loss (16-25 GHz)
< -10 dB
Error Detector input range
50 - 800 mV differential
TX/RX connectors
4x 8 channel M-SMPM foot print on front channel
Reference clock
Reference clock
Reference Clock Output
156.25 MHz
Clean Clock
Used as high frequency trigger in clean (jitter disabled) or jitter mode: Reference Clock multiplied by an integer ranging from 2 to 30
Diff. Input Return Loss
Better than 10 dB
Eye monitor resolution
8 bits horizontal across 2 UI / 9 bits vertical
Clock Input Range
Up to 4.4 GHz
Clock Input Amplitude
200 - 1000 mV
Input Impedance
50 Ω
Ambient Temperature
0 - 75 °C
Power
110 V, 1.4 A or 220 V, 0.9 A ? 50/60 Hz
bottom of page