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Optical Testing Products
SE1770DO
Adds capabilities for GPON, EPON, 10GPON testing. 2 Filter inputs and outputs accessible from the faceplate. A Burst control signal generator for asymmetric PON CDR mode for the DSO + FPGA
![SE1770DO-10[1].jpg](https://static.wixstatic.com/media/344984_64735e72dc72485ead45fcae82413648~mv2.jpg/v1/fill/w_447,h_160,al_c,q_80,usm_0.66_1.00_0.01,enc_avif,quality_auto/SE1770DO-10%5B1%5D.jpg)
![SE1770DO-XFP[1].jpg](https://static.wixstatic.com/media/344984_052419a953ed494688c7ad95700abc1b~mv2.jpg/v1/fill/w_447,h_165,al_c,q_80,usm_0.66_1.00_0.01,enc_avif,quality_auto/SE1770DO-XFP%5B1%5D.jpg)
SE1770DO-XFP
The SE1770D0-XFP is an advanced yet cost-effective PON tester that integrates a BERT, Digital Sampling Oscilloscope (DSO), and optical scope within a compact 2U cPCI form factor. It supports burst-mode PON testing with a user-programmable AWG output, enabling the generation of custom 64-bit TTL signals synchronized with high-speed data. This all-in-one solution is ideal for precise testing and validation of PON systems.
SE1770DO-10
The SE1770D0-10 is a state of the art, low cost PON tester consisting of a BERT, Digital Sampling Oscilloscope and an optical scope, all integrated in a compact 2U cPCI form factor. It supports burst mode PON by providing a programmable AWG output that can be programmed by the user to output a custom 64 bit TTL signal, synchronous to the high-speed data.
![SE1770DO-10[1].jpg](https://static.wixstatic.com/media/344984_64735e72dc72485ead45fcae82413648~mv2.jpg/v1/fill/w_293,h_165,al_c,q_80,usm_0.66_1.00_0.01,enc_avif,quality_auto/SE1770DO-10%5B1%5D.jpg)
SE1770DO-10
The SE1770D0-10 is a cutting-edge, cost-efficient PON tester that combines a BERT, Digital Sampling Oscilloscope (DSO), and optical scope into a compact 2U cPCI form factor. It supports burst-mode PON testing with a programmable AWG output, allowing users to generate custom 64-bit TTL signals synchronized with high-speed data. This integrated solution is ideal for precise PON system testing and validation.
![SE1770DO-25[1].jpg](https://static.wixstatic.com/media/344984_8e94be2c19b3416dbac2993687ec3e95~mv2.jpg/v1/fill/w_295,h_166,al_c,q_80,usm_0.66_1.00_0.01,enc_avif,quality_auto/SE1770DO-25%5B1%5D.jpg)
SE1770DO-25
The SE1770DO-25 is an advanced, cost-effective PON tester that integrates a BERT, Digital Sampling Oscilloscope (DSO), and optical scope within a compact 2U cPCI form factor. It is designed for burst-mode PON testing, featuring a programmable AWG output that allows users to generate custom 64-bit TTL signals synchronized with high-speed data. This all-in-one solution is ideal for accurate testing and validation of PON systems
![SE1770DO-32[1].jpg](https://static.wixstatic.com/media/344984_1c5c230163ca448da80a5a264cfad429~mv2.jpg/v1/fill/w_295,h_166,al_c,q_80,usm_0.66_1.00_0.01,enc_avif,quality_auto/SE1770DO-32%5B1%5D.jpg)
SE1770DO-32
The SE1770D0-32 is a high-efficiency PON testing solution that combines a BERT, digital sampling oscilloscope (DSO), and optical analyzer in a compact 2U cPCI format. It supports burst-mode PON testing with a configurable AWG output, allowing users to create custom 64-bit TTL signal patterns synchronized with fast data streams. This multi-functional tool is optimized for accurate testing and validation of PON networks.