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DSO Products
![SE1770DO-B16[1].jpg](https://static.wixstatic.com/media/344984_86203de9c2194ef89cc1ab1a6367d6c3~mv2.jpg/v1/fill/w_443,h_161,al_c,q_80,usm_0.66_1.00_0.01,enc_avif,quality_auto/SE1770DO-B16%5B1%5D.jpg)
SE1770DO-B16
The SE1770DO-B16 is a cutting-edge, cost-effective PON tester that integrates a BERT, Digital Sampling Oscilloscope (DSO), and optical scope within a compact 2U cPCI form factor. It supports burst-mode PON testing with a programmable AWG output, enabling users to generate custom 64-bit TTL signals synchronized with high-speed data.

SE1746
The SE1746 enhances its functionality by adding support for GPON, EPON, and 10GPON testing. It features two filter inputs and outputs accessible directly from the faceplate, providing easy connectivity. Additionally, it includes a burst control signal generator designed for asymmetric PON CDR mode, leveraging the combined capabilities of the Digital Sampling Oscilloscope (DSO) and FPGA for advanced signal management and testing.
![SE1770DO-XFP[1].jpg](https://static.wixstatic.com/media/344984_052419a953ed494688c7ad95700abc1b~mv2.jpg/v1/fill/w_306,h_172,al_c,q_80,usm_0.66_1.00_0.01,enc_avif,quality_auto/SE1770DO-XFP%5B1%5D.jpg)
SE1770DO-XFP
The SE1770D0-XFP is an advanced yet cost-effective PON tester that integrates a BERT, Digital Sampling Oscilloscope (DSO), and optical scope within a compact 2U cPCI form factor. It supports burst-mode PON testing with a user-programmable AWG output, enabling the generation of custom 64-bit TTL signals synchronized with high-speed data. This all-in-one solution is ideal for precise testing and validation of PON systems.
![SE1770DO-10[1].jpg](https://static.wixstatic.com/media/344984_64735e72dc72485ead45fcae82413648~mv2.jpg/v1/fill/w_306,h_172,al_c,q_80,usm_0.66_1.00_0.01,enc_avif,quality_auto/SE1770DO-10%5B1%5D.jpg)
SE1770DO-10
The SE1770D0-10 is a cutting-edge, cost-efficient PON tester that combines a BERT, Digital Sampling Oscilloscope (DSO), and optical scope into a compact 2U cPCI form factor. It supports burst-mode PON testing with a programmable AWG output, allowing users to generate custom 64-bit TTL signals synchronized with high-speed data. This integrated solution is ideal for precise PON system testing and validation.
![SE1770DO-25[1].jpg](https://static.wixstatic.com/media/344984_8e94be2c19b3416dbac2993687ec3e95~mv2.jpg/v1/fill/w_288,h_162,al_c,q_80,usm_0.66_1.00_0.01,enc_avif,quality_auto/SE1770DO-25%5B1%5D.jpg)
SE1770DO-25
The SE1770DO-25 is an advanced, cost-effective PON tester that integrates a BERT, Digital Sampling Oscilloscope (DSO), and optical scope within a compact 2U cPCI form factor. It is designed for burst-mode PON testing, featuring a programmable AWG output that allows users to generate custom 64-bit TTL signals synchronized with high-speed data. This all-in-one solution is ideal for accurate testing and validation of PON systems
![SE1770DO-32[1].jpg](https://static.wixstatic.com/media/344984_1c5c230163ca448da80a5a264cfad429~mv2.jpg/v1/fill/w_288,h_162,al_c,q_80,usm_0.66_1.00_0.01,enc_avif,quality_auto/SE1770DO-32%5B1%5D.jpg)
SE1770DO-32
The SE1770D0-32 is a high-efficiency PON testing solution that combines a BERT, digital sampling oscilloscope (DSO), and optical analyzer in a compact 2U cPCI format. It supports burst-mode PON testing with a configurable AWG output, allowing users to create custom 64-bit TTL signal patterns synchronized with fast data streams. This multi-functional tool is optimized for accurate testing and validation of PON networks.