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BERT Products
SE1706L
The SE1706L is a fully automated network loopback verifier designed for 25G and 100G systems, ensuring signal fidelity and validating the CMIS protocol compliance of SFP28 and QSFP28 loopbacks. Tailored for production lines and deployment scenarios, it delivers fast diagnostics and reliable performance for high-bandwidth network infrastructures.
![SE1706-JA[1].jpg](https://static.wixstatic.com/media/344984_09947f1873fc4433a2321e9be2d0eef6~mv2.jpg/v1/fill/w_363,h_275,al_c,q_80,usm_0.66_1.00_0.01,enc_avif,quality_auto/SE1706-JA%5B1%5D.jpg)
SE1706-JA
The SE1706-JA is a 4x30 Gbps BERT designed for NRZ signal generation, essential for 100 Gb measurements. It is ideal for production testing of systems, components, and Electro-Optical Modules. The device supports test patterns in compliance with IEEE and OIF standards. Additional features include signal-to-noise ratio (SNR) analysis, histogram measurements, and built-in transmitter and receiver equalizers.
![SE1731-CTL[1].jpg](https://static.wixstatic.com/media/344984_a1e9b04ce4984b32949192df8f52281e~mv2.jpg/v1/fill/w_272,h_153,al_c,q_80,usm_0.66_1.00_0.01,enc_avif,quality_auto/SE1731-CTL%5B1%5D.jpg)
SE1731-CTL
The SE1731-CTL offers an efficient and user-friendly solution for programming and testing SE1731-CTL thermal modules. It supplies power and facilitates I2C communication, enabling access to any register within the module’s memory via the I2C bus. Users can control power settings and monitor key parameters such as voltage, temperature, current and power, ensuring precise module management and testing.
SE1731-TL
SE1731 - TL is used for testing OSFP-XD transceiver ports under board level tests, by substituting a full-featured OSFP-XD transceiver with the SE1731 - TL. The SE1731 - TL covers all OSFP-XD power classes. The SE1731 - TL is packaged in a standard MSA housing compatible with all OSFP-XD ports. It provides an economical way to exercise OSFP-XD ports during R&D validation, production testing, and field testing. It follows the CMIS standard.
![SE1732[1].jpg](https://static.wixstatic.com/media/344984_65c885779c0045aeade8b60ae58898e0~mv2.jpg/v1/fill/w_405,h_228,al_c,q_80,usm_0.66_1.00_0.01,enc_avif,quality_auto/SE1732%5B1%5D.jpg)
SE1732
The SE1732 is a high-performance Digital Sampling Oscilloscope (DSO) with integrated Clock Data Recovery (CDR). It provides precise analysis at 32 GHz or 50 GHz to evaluate the performance of transmitters and receivers, leveraging statistical under-sampling techniques. With robust software libraries, it supports, jitter analysis, and NRZ/PAM4 data processing. The SE1732 is tailored for both characterization and manufacturing environments, ensuring accurate and reliable signal assessment.
![SE1750[1].jpg](https://static.wixstatic.com/media/344984_1e3734c2e6734ae7860d7138a1e1c947~mv2.jpg/v1/fill/w_405,h_228,al_c,q_80,usm_0.66_1.00_0.01,enc_avif,quality_auto/SE1750%5B1%5D.jpg)
SE1750
The SE1750 is an advanced Digital Sampling Oscilloscope (DSO) with Clock Data Recovery (CDR) capabilities. It performs precise eye-diagram analysis at 32 GHz or 50 GHz to assess transmitter and receiver quality, using statistical under-sampling techniques. Equipped with comprehensive software libraries, it supports eye measurements, jitter analysis, and NRZ/PAM4 data processing.
![SE1792-A2[1].jpg](https://static.wixstatic.com/media/344984_68ce6599373a43b4be7d2939011599f8~mv2.jpg/v1/fill/w_376,h_212,al_c,q_80,usm_0.66_1.00_0.01,enc_avif,quality_auto/SE1792-A2%5B1%5D.jpg)
SE1792-A2
The SE1792-A2-gen2 is an advanced 4-channel Digital Sampling Oscilloscope (DSO) offered as an ATE board. It provides precise eye diagram analysis at 35 GHz to evaluate transmitter performance, leveraging statistical under-sampling techniques. Equipped with comprehensive software libraries, it supports eye measurements, jitter analysis, and the processing of NRZ and PAM4 data formats, ensuring reliable signal characterization.
SE1702
The SE1702 is an advanced instrument that functions as both a Time Domain Reflectometer/Transmission (TDR/TDT) and a Digital Sampling Oscilloscope (DSO). This DSO offers precise eye diagram analysis up to 35 GHz, enabling detailed characterization of transmitter and receiver performance using statistical under-sampling techniques. It comes with extensive software libraries for eye measurements, jitter analysis, and processing of NRZ and PAM4 data formats. The true differential TDR/TDT feature provides simultaneous measurement across four channels to assess impedance profiles, as well as reflection and transmission losses. Designed for both characterization and manufacturing purposes, it supports 4 differential PPG ports capable of generating 53 Gbps NRZ pulse patterns, facilitating Sdd21 measurements beyond 35 GHz. The SE1702 offers TDR measurement capabilities over distances of up to 10 meters, with a pulse rise time of 12 ps, making it possible to detect impedance discontinuities as close as 1.5 mm apart. It also boasts a 60 dB dynamic range, ensuring high precision and performance.
![SE1770DO-B16[1].jpg](https://static.wixstatic.com/media/344984_86203de9c2194ef89cc1ab1a6367d6c3~mv2.jpg/v1/fill/w_277,h_156,al_c,q_80,usm_0.66_1.00_0.01,enc_avif,quality_auto/SE1770DO-B16%5B1%5D.jpg)
SE1770DO-B16
The SE1770DO-B16 is a cutting-edge, cost-effective PON tester that integrates a BERT, Digital Sampling Oscilloscope (DSO), and optical scope within a compact 2U cPCI form factor. It supports burst-mode PON testing with a programmable AWG output, enabling users to generate custom 64-bit TTL signals synchronized with high-speed data.
SE1746
The SE1746 is an 800G BERT ready to support the newly emerging 8 x 100 Gbps technology cycle. Most importantly it supports real hardware FEC analysis to be able to understand the DUT behavior in a system environment. Other features include signal-to-noise ratio (SNR) and histogram measurements, as well as transmitter and receiver equalizers. SE1746 has uniquely integrated jitter and noise injection to support IEEE JTOL and ITOL measurements.